COSTEL DOREL FLOREA, CORNELIU MUNTEANU, NICANOR CIMPOESU, IOAN GABRIEL SANDU, CONSTANTIN BACIU, COSTICA BEJINARIU CHARACTERIZATION OF ADVANCED CERAMIC MATERIALS THIN FILMS DEPOSITED ON FE-C SUBSTRATE Complex ceramic superficial ceramic layers (Al2O3, SiO2, YO, ZrO2) were obtained by atmospheric plasma deposition, industrial wide application method, on a metal support Fe-C (FC 250). The substrate was sandblasted mechanically prior to depositing 6 successive layers of ceramic material. The obtained layers were analyzed structurally (scanning electron microscopy, SEM), chemical (spectroscopy of X-ray, EDAX) and mechanically (scratch tests) to characterize the new compound material obtained (thin layer-substrate). It was observed from the experimental results that there was a relationship between the state of the surface of the substrate and the adhesion of the ceramic layers to the metal surface.
Keywords: complex ceramic, plasma, SEM, EDAX, scratch